Microelectronics & Components — Space Hardware Marketplace

142 flight-proven satellite platforms, components and ground equipment from verified manufacturers worldwide.

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Microelectronics & Components

RF & Microwave Testing

ALTER Technology
  • Frequency Range300 MHz to 300 GHz
  • Technology CoverageMMIC, microstrip, coaxial, rectangular waveguide
  • Design MethodsDistributed circuit elements, transmission-line theory

ALTER Technology provides a full set of RF and microwave testing activities covering traditional low-frequency EEE components and…

Microelectronics & Components

Materials and Processes Laboratory

ALTER Technology
  • PCB StandardsIPC-A-600, IPC-A-610, ECSS-Q-ST-70-60C, ECSS-Q-ST-70-61C
  • Crimp StandardECSS-Q-ST-70-26C
  • Materials Analysis TechniquesSEM-EDS, Raman Microscopy, FT-IR, XPS

ALTER Technology's Materials & Processes Lab offers cross-section analysis, PCB qualification, crimp quality services, advanced materials analysis (SEM-EDS,…

Microelectronics & Components

Environmental Testing for Space Components

ALTER Technology
  • Thermal TestsAccelerated bias aging, cryogenic evaluation, HAST, humidity, temperature cycling, thermal shock, thermal vacuum
  • Mechanical TestsMechanical testing, preconditioning, radiation testing, salt atmosphere testing
  • Compliance TestsIP testing, EMC testing

ALTER Technology provides ENAC-accredited environmental testing simulating temperature, humidity, mechanical stress, and radiation conditions for space and high-reliability…

Microelectronics & Components

Mechanical Testing for Space Components

ALTER Technology
  • Constant Acceleration CapabilityUp to 50,000 g
  • Vibration Test TypesSine, random, sine-on-random, random-on-random
  • Vibration StandardsECSS-Q-ST-70-08C, ECSS-Q-ST-70-38C, EN 60068-2-6, EN 60068-2-64, ISO 19683, EN 61373

ALTER Technology provides vibration, shock, and constant acceleration testing for space components to validate structural integrity under launch…

Microelectronics & Components

Component Qualification Services

ALTER Technology
  • Failure AnalysisRoot cause investigation of component failures
  • Counterfeit DetectionIdentification and elimination of counterfeit components
  • Constructional AnalysisInternal structure evaluation for design integrity

ALTER Technology rigorously assesses and certifies EEE components for space missions through failure analysis, counterfeit detection, constructional analysis,…

Microelectronics & Components

Cryogenic and Space Vacuum Testing

ALTER Technology
  • Test EnvironmentDeep vacuum and cryogenic temperatures
  • Quantum ApplicationsSingle-photon detectors, superconducting circuits, entangled photon sources
  • Qualification TestsOutgassing behavior, thermal contraction, mechanical integrity

ALTER Technology provides cryogenic and space vacuum testing services using deep vacuum chambers and cryostats to qualify image…

Microelectronics & Components

Radiation Test – RADLAB

ALTER Technology
  • TID Dose Rate>100 Krad(Si)/h
  • TID Source TypeCobalt-60 (panoramic, cell, and pool sources)
  • TID Biasing ModesStatic and dynamic biasing

ALTER RADLAB provides comprehensive radiation testing for EEE components used in space and high-reliability applications, covering total ionizing…

Microelectronics & Components

TAB®PLUS Long-Term Conservation System

ALTER Technology
  • Preservation DurationUp to 50 years
  • Core TechnologyControlled atmosphere with absorbers and temperature-managed diffusion control
  • Protection MechanismsEliminates harmful gases, blocks intermetallic growth, multi-layer functional packaging

TAB®PLUS is a proprietary controlled-atmosphere system for preserving electronic components for up to 50 years, actively suppressing aging…