HARDWARE / PRODUCT

SNIFT

TICRA
SNIFT

Accurate and highly stable transformation of measured spherical near-field antenna data to far fields, accounting for the full characteristics of the measuring probe.

Technical specifications

Feature
Allows full sphere or partial sphere input data
Feature
Full correction for axially symmetric (m=±1) probes
Feature
Fast Fourier Transformation and self-stabilising recurrence relations allow handling of even very large antenna structures
Feature
Industry standard for spherical near-field to far-field transformation with probe correction
Feature
Independent of the actual measurement system implementation
Benefit
Short transformation time
Benefit
Mathematically exact pattern transformation
Benefit
Output coordinate system may be rotated to coincide with the peak direction of the far field
Benefit
Non-Maxwellian measurement inaccuracies are averaged to physically correct output
Benefit
Noise reduction by means of high-order spherical mode filtering

About

SNIFT is the industry standard for spherical near-field to far-field transformation with probe correction, independent of the actual measurement system implementation. If only a certain region of the antenna pattern is of interest, truncated measurements can still be transformed with SNIFT; the supplementary program ROSCOE can then perform coordinate transformation into a system centered around the peak when the region of interest doesn’t coincide with the measurement coordinate axes. A well-founded choice of numerical implementation ensures a very stable algorithm, even for high-order harmonics — antennas with diameters exceeding several hundred wavelengths are handled within seconds on a standard PC with accurate determination of all involved spherical harmonics.

Documentation

Need the full ICD, test reports or a specific revision? Ask the supplier directly.

Source: www.ticra.com ↗