SOC-100 Hemispherical Directional Reflectometer
Surface Optics Corporation
FTIR-attachment reflectometer measuring polarized, angular diffuse reflectance from 8 to 80 degrees incidence across 2.0-25.0 micron.
Technical specifications
- Spectral range
- 2.0-25.0 micron (5000-400 cm-1)
- Method
- Automated reflectometer with 18-inch electroformed hemiellipsoid
- Calibration
- Comparison scans vs. calibrated specular gold standard
- Source
- Custom heated cavity, 0.75-inch ID opening
- Resolution options
- 2/4/8/16/32 cm-1
- Standard sample size
- 1-inch OD (up to 3x4 inch accommodated)
- Automation
- 5 stepper motors
- Incident angles
- Up to 12 per measurement
- Purge gas
- 0.5-1.0 SCFM inert N2/CDA
- Operating temperature
- 60-80 degrees F
About
The SOC-100 measures polarized, angular diffuse reflectance from 8 to 80 degree incident angles in the 2.0-25.0 micron spectral range as an attachment to a Thermo Scientific Nicolet iS50 FTIR spectrometer. Capabilities include separation of reflectance into diffuse and specular components, transmittance measurement, directional emittance measurement beyond 500 degrees C, and total hemispherical emittance analysis, supporting thermal control material characterization for spacecraft and instrumentation.
Documentation
Need the full ICD, test reports or a specific revision? Ask the supplier directly.
